P. Llinares
发表
Annick Penarier,
C. Delseny,
F. Pascal,
2000
.
P. Llinares,
J. C. Vildeuil,
M. Marin,
2004,
Microelectron. Reliab..
Gerard Ghibaudo,
J. A. Chroboczek,
P. Llinares,
1998,
ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).
R. Difrenza,
G. Ghibaudo,
P. Llinares,
2000,
30th European Solid-State Device Research Conference.
R. Difrenza,
Gerard Ghibaudo,
H. Brut,
2001,
ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153).
R. Palla,
R. Difrenza,
P. Llinares,
2002,
Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002..
O. Faynot,
Denis Flandre,
L. Picheta,
2002
.
Gerard Ghibaudo,
P. Llinares,
R. Difrenza,
2003
.
O. Rozeau,
G. Auvert,
L. Ailloud,
1997,
International Electron Devices Meeting. IEDM Technical Digest.
Alain Chantre,
Daniel Gloria,
M. Laurens,
1999
.
M. Marin,
P. Llinares,
Y. Akue Allogo,
2002
.
Retarding effect of surface base compensation on degradation of noise characteristics of BiCMOS BJTs
Gerard Ghibaudo,
L. Vendrame,
J. A. Chroboczek,
1997
.
P. Llinares,
M. Valenza,
J. C. Vildeuil,
2002
.
Geoffroy Auvert,
Alain Chantre,
L. Ailloud,
1999
.
G. Ghibaudo,
R. Difrenza,
G. Morin,
2001,
31st European Solid-State Device Research Conference.
N. Planes,
N. Revil,
B. Tavel,
2003,
IEEE International Electron Devices Meeting 2003.
Gerard Ghibaudo,
J. A. Chroboczek,
P. Llinares,
1997
.
D. Celi,
Gerard Ghibaudo,
J. A. Chroboczek,
1997
.