Juan Boon Tan

发表

Juan Boon Tan, Kwang Sing Yew, Ramasamy Chockalingam, 2019, 2019 Electron Devices Technology and Manufacturing Conference (EDTM).

Zhong Chen, Kai Chong Chan, Yeow Kheng Lim, 2009, Microelectron. Reliab..

Yan Tse Tak, Juan Boon Tan, Alex Tsun-Lung Cheng, 1999, Advanced Lithography.

Tupei Chen, Jianxun Sun, Juan Boon Tan, 2020, IEEE Transactions on Electron Devices.

John H. Lau, Xiaowu Zhang, Vempati Srinivasa Rao, 2010, Microelectron. Reliab..

Juan Boon Tan, Shan Gao, Rick Reed, 2015, 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC).

Wei Liu, Juan Boon Tan, Soh Yun Siah, 2014, IEEE International Interconnect Technology Conference.

Chee Lip Gan, Yeow Kheng Lim, Juan Boon Tan, 2011, 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Juan Boon Tan, Y. Siew, L. Hsia, 2003 .

Juan Boon Tan, W. Yi, Shaoqiang Zhang, 2014, IEEE International Interconnect Technology Conference.

Juan Boon Tan, A. Du, Siping Zhao, 2012, 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Juan Boon Tan, W. Yi, K. S. Yew, 2022, 2022 IEEE International Reliability Physics Symposium (IRPS).

Juan Boon Tan, Xu Zeng, H. Yao, 2018, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Juan Boon Tan, K. C. Chan, Xiaowu Zhang, 2007, 2007 9th Electronics Packaging Technology Conference.

Juan Boon Tan, Tupei Chen, Jianxun Sun, 2020, IEEE Transactions on Electron Devices.