Sergei S. Ostapenko

Ultrasound treatment as a new way for defect engineering in semiconductor materials and devices

M. K. Sheinkman, Nadejda E. Korsunskaya, Sergei S. Ostapenko, 1998, 1998 International Semiconductor Conference. CAS'98 Proceedings (Cat. No.98TH8351).

Reversible and non-reversible photo-enhanced luminescence in CdSe/ZnS quantum dots

Sergei S. Ostapenko, T. Zhukov, S. Ostapenko, 2005 .

Resonance ultrasonic vibration diagnostics of elastic stress in full-size silicon wafers

Sergei S. Ostapenko, J. P. Kalejs, D. Hess, 2006 .

Crack detection in single-crystalline silicon wafers using impact testing

D. P. Hess, Sergei S. Ostapenko, W. Dallas, 2008 .

Crack Detection and Analyses Using Resonance Ultrasonic Vibrations in Full-Size Crystalline Silicon Wafers

Sergei S. Ostapenko, John Wohlgemuth, O. Polupan, 2005 .

Defect monitoring using scanning photoluminescence spectroscopy in multicrystalline silicon wafers

Sergei S. Ostapenko, J. P. Kalejs, I. Tarasov, 2000 .

Audible vibration diagnostics of thermo-elastic residual stress in multi-crystalline silicon wafers

D. P. Hess, Sergei S. Ostapenko, J. P. Kalejs, 2006 .