H Xie

Characterizing piezoscanner hysteresis and creep using optical levers and a reference nanopositioning stage.

M. Rakotondrabe, S. Régnier, H. Xie, 2009, The Review of scientific instruments.

Phase-shifting moireí method with an atomic force microscope.

A Asundi, C G Boay, Y Lu, 2001, Applied optics.