Stefan Dilhaire

发表

Thermomechanical deformation imaging of power devices by Electronic Speckle Pattern Interferometry (ESPI)

Luc Joannes, E. Schaub, Alain Cornet, 1998 .

BiCMOS thermal sensor circuit for built-in test purposes

Antonio Rubio, E. Schaub, Josep Altet, 1998 .

Differential Thermal Testing: An Approach to its Feasibility

Hideo Tamamoto, Antonio Rubio, Josep Altet, 1999, J. Electron. Test..

Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods

Stefan Dilhaire, Wilfrid Claeys, M. Amine Salhi, 2003, Microelectron. Reliab..

Determination of passive SiO2-Au microstructure resonant frequencies

Guillaume Marinier, Stefan Dilhaire, Luis David Patiño Lopez, 2003, Microelectron. Reliab..

Temperature measurements of metal lines under current stress by high-resolution laser probing

Véronique Quintard, Stefan Dilhaire, Wilfrid Claeys, 1999, IEEE Trans. Instrum. Meas..

Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy

Jean-Christophe Batsale, Stefan Dilhaire, Wilfrid Claeys, 2004, Microelectron. J..

Applications of temperature phase measurements to IC testing

Antonio Rubio, Jean-Christophe Batsale, Josep Altet, 2004, Microelectron. Reliab..

Joule expansion imaging techniques on microlectronic devices

Stefan Dilhaire, Wilfrid Claeys, M. Amine Salhi, 2007, 2007 13th International Workshop on Thermal Investigation of ICs and Systems (THERMINIC).

Thermal testing: fault location strategies

Antonio Rubio, Josep Altet, Stefan Dilhaire, 2000, Proceedings 18th IEEE VLSI Test Symposium.

Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues

Stefan Dilhaire, Wilfrid Claeys, M. Amine Salhi, 2008, Microelectron. Reliab..

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits

Dean Lewis, Yves Danto, Vincent Pouget, 2003, Microelectron. Reliab..

Sensing temperature in CMOS circuits for thermal testing

André Ivanov, Antonio Rubio, Josep Altet, 2004, 22nd IEEE VLSI Test Symposium, 2004. Proceedings..

Laser diode COFD analysis by thermoreflectance microscopy

Stefan Dilhaire, Wilfrid Claeys, Emmanuel Schaub, 2001, Microelectron. Reliab..

Thermal coupling in integrated circuits: application to thermal testing

Antonio Rubio, E. Schaub, Josep Altet, 2001, IEEE J. Solid State Circuits.

ElectroStatic Discharge Fault Localization by Laser Probing

Stefan Dilhaire, Wilfrid Claeys, M. Amine Salhi, 2005, Microelectron. Reliab..

Time gating imaging through thick silicon substrate: a new step towards backside characterisation

Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, 2006, Microelectron. Reliab..

Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers

Antonio Rubio, Diego Mateo, Josep Altet, 2008, 2008 13th European Test Symposium.

Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers

José Luis González, Ferran Reverter, Diego Mateo, 2014, Microelectron. J..

Ultrafast heterodyne optical sampling applied to picosecond ultrasonics and nanoscale heat transfer

Eric Mottay, Stefan Dilhaire, Sebastien Ermeneux, 2009, LASE.

Temperature measurements on metallic lines under current stresses by laser probing and correlation with electromigration tests at wafer level

P. Mortini, Stefan Dilhaire, Wilfrid Claeys, 1993, Other Conferences.

Dynamic Surface Temperature Measurements in ICs

Antonio Rubio, Josep Altet, Stefan Dilhaire, 2006, Proceedings of the IEEE.

Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope

Stefan Dilhaire, Wilfrid Claeys, Sebastian Volz, 2004, Microelectron. J..

Strain energy imaging of a power MOS transistor using speckle interferometry

Stefan Dilhaire, Wilfrid Claeys, Stéphane Grauby, 2004, IEEE Transactions on Reliability.

Dynamical behavior and cut-off frequency of Si/SiGe microcoolers

Ali Shakouri, Stefan Dilhaire, Wilfrid Claeys, 2007 .

Imaging setup for temperature, topography, and surface displacement measurements of microelectronic devices

Stefan Dilhaire, Wilfrid Claeys, Stéphane Grauby, 2003 .

Testing of the quality of solder joints through the analysis of their thermal behaviour with an interferometric laser probe

Dean Lewis, Yves Danto, Stefan Dilhaire, 1994 .

Specific-heat measurement of single metallic, carbon, and ceramic fibers at very high temperature

Jean-Christophe Batsale, Stefan Dilhaire, Christophe Pradere, 2005 .

Anisotropic propagation imaging of elastic waves in oriented columnar thin films

Nicolas Martin, Stefan Dilhaire, Jean-Michel Rampnoux, 2017 .

Study of thermomechanical properties of Si∕SiGe superlattices using femtosecond transient thermoreflectance technique

Ali Shakouri, Stefan Dilhaire, Gehong Zeng, 2005 .

Calibration-free heat source localisation in ICs entirely covered by metal layers

Andre Ivanov, Josep Altet, Stefan Dilhaire, 2004 .

Localisation of heat sources in electronic circuits by microthermal laser probing 1 Based on a paper

Antonio Rubio, Josep Altet, Stefan Dilhaire, 2000 .

Thermal and thermomechanical study of micro-refrigerators on a chip based on semiconductor heterostructures

Ali Shakouri, Stefan Dilhaire, Wilfrid Claeys, 2003, Proceedings ICT'03. 22nd International Conference on Thermoelectrics (IEEE Cat. No.03TH8726).

Thermoreflectance optical test probe for the measurement of current-induced temperature changes in microelectronic components

Yves Danto, J. P. Dom, Stefan Dilhaire, 1993 .

The method of dynamic separation and its application to quantitative thermal analysis of microelectronic devices by laser interferometry and reflectometry

Dean Lewis, Stefan Dilhaire, Wilfrid Claeys, 1997 .

Fault localisation in ICs by goniometric laser probing of thermal induced surface waves

Antonio Rubio, Josep Altet, Stefan Dilhaire, 1999 .

Dynamic Surface Temperature Measurements in ICs High-sensitivity, high-resolution thermal mapping of integrated circuits can be provided by techniques such as scanning with laser beams and embedding of CMOS temperature sensors.

Antonio Rubio, Josep Altet, Stefan Dilhaire, 2006 .

Titanium-based silicide quantum dot superlattices for thermoelectrics applications

Stefan Dilhaire, Laurent Montès, Guillaume Savelli, 2015, Nanotechnology.

Nanoscale Block Copolymer Ordering Induced by Visible Interferometric Micropatterning: A Route towards Large Scale Block Copolymer 2D Crystals

Christophe Navarro, Stefan Dilhaire, Georges Hadziioannou, 2013, Advanced materials.

Heterodyne picosecond thermoreflectance applied to nanoscale thermal metrology

Stefan Dilhaire, Stéphane Grauby, Jean-Michel Rampnoux, 2011 .

A heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits

E. Aldrete-Vidrio, Miquel Vellvehi, Diego Mateo, 2008 .

Thermomechanical study of AlCu based interconnect under pulsed thermoelectric excitation

Dean Lewis, Stefan Dilhaire, Wilfrid Claeys, 1997 .

Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

E. Aldrete-Vidrio, Marvin Onabajo, Jose Silva-Martinez, 2010 .

Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging technique.

Stefan Dilhaire, Wilfrid Claeys, Stéphane Grauby, 2003, Applied optics.

Optical method for the measurement of the thermomechanical behaviour of electronic devices

Alain Cornet, Stefan Dilhaire, Wilfrid Claeys, 1999 .

Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions

Stefan Dilhaire, Wilfrid Claeys, Stéphane Grauby, 2004 .

Laser beam thermography of circuits in the particular case of passivated semiconductors

G. Deboy, Dean Lewis, Stefan Dilhaire, 1996 .