Wilfrid Claeys

发表

Thermomechanical deformation imaging of power devices by Electronic Speckle Pattern Interferometry (ESPI)

Luc Joannes, E. Schaub, Alain Cornet, 1998 .

BiCMOS thermal sensor circuit for built-in test purposes

Antonio Rubio, E. Schaub, Josep Altet, 1998 .

Differential Thermal Testing: An Approach to its Feasibility

Hideo Tamamoto, Antonio Rubio, Josep Altet, 1999, J. Electron. Test..

Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods

Stefan Dilhaire, Wilfrid Claeys, M. Amine Salhi, 2003, Microelectron. Reliab..

Temperature measurements of metal lines under current stress by high-resolution laser probing

Véronique Quintard, Stefan Dilhaire, Wilfrid Claeys, 1999, IEEE Trans. Instrum. Meas..

Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy

Jean-Christophe Batsale, Stefan Dilhaire, Wilfrid Claeys, 2004, Microelectron. J..

Applications of temperature phase measurements to IC testing

Antonio Rubio, Jean-Christophe Batsale, Josep Altet, 2004, Microelectron. Reliab..

Joule expansion imaging techniques on microlectronic devices

Stefan Dilhaire, Wilfrid Claeys, M. Amine Salhi, 2007, 2007 13th International Workshop on Thermal Investigation of ICs and Systems (THERMINIC).

Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues

Stefan Dilhaire, Wilfrid Claeys, M. Amine Salhi, 2008, Microelectron. Reliab..

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits

Dean Lewis, Yves Danto, Vincent Pouget, 2003, Microelectron. Reliab..

Measurement of the thermomechanical strain of electronic devices by shearography

Alain Cornet, Wilfrid Claeys, S. Dilhaire, 2000 .

Laser diode COFD analysis by thermoreflectance microscopy

Stefan Dilhaire, Wilfrid Claeys, Emmanuel Schaub, 2001, Microelectron. Reliab..

Thermal coupling in integrated circuits: application to thermal testing

Antonio Rubio, E. Schaub, Josep Altet, 2001, IEEE J. Solid State Circuits.

ElectroStatic Discharge Fault Localization by Laser Probing

Stefan Dilhaire, Wilfrid Claeys, M. Amine Salhi, 2005, Microelectron. Reliab..

Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers

José Luis González, Ferran Reverter, Diego Mateo, 2014, Microelectron. J..

Temperature measurements on metallic lines under current stresses by laser probing and correlation with electromigration tests at wafer level

P. Mortini, Stefan Dilhaire, Wilfrid Claeys, 1993, Other Conferences.

Dynamic Surface Temperature Measurements in ICs

Antonio Rubio, Josep Altet, Stefan Dilhaire, 2006, Proceedings of the IEEE.

Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope

Stefan Dilhaire, Wilfrid Claeys, Sebastian Volz, 2004, Microelectron. J..

Strain energy imaging of a power MOS transistor using speckle interferometry

Stefan Dilhaire, Wilfrid Claeys, Stéphane Grauby, 2004, IEEE Transactions on Reliability.

Dynamical behavior and cut-off frequency of Si/SiGe microcoolers

Ali Shakouri, Stefan Dilhaire, Wilfrid Claeys, 2007 .

Imaging setup for temperature, topography, and surface displacement measurements of microelectronic devices

Stefan Dilhaire, Wilfrid Claeys, Stéphane Grauby, 2003 .

Absolute measurement of transient carrier concentration and temperature gradients in power semiconductor devices by internal IR-laser deflection

G. Deboy, Wilfrid Claeys, Eckhard Wolfgang, 1996 .

Testing of the quality of solder joints through the analysis of their thermal behaviour with an interferometric laser probe

Dean Lewis, Yves Danto, Stefan Dilhaire, 1994 .

Laser probes for the thermal and thermomechanical characterisation of microelectronic devices

Wilfrid Claeys, S. Dilhaire, S. Jorez, 2001 .

Localisation of heat sources in electronic circuits by microthermal laser probing 1 Based on a paper

Antonio Rubio, Josep Altet, Stefan Dilhaire, 2000 .

Thermal and thermomechanical study of micro-refrigerators on a chip based on semiconductor heterostructures

Ali Shakouri, Stefan Dilhaire, Wilfrid Claeys, 2003, Proceedings ICT'03. 22nd International Conference on Thermoelectrics (IEEE Cat. No.03TH8726).

Thermoreflectance optical test probe for the measurement of current-induced temperature changes in microelectronic components

Yves Danto, J. P. Dom, Stefan Dilhaire, 1993 .

The method of dynamic separation and its application to quantitative thermal analysis of microelectronic devices by laser interferometry and reflectometry

Dean Lewis, Stefan Dilhaire, Wilfrid Claeys, 1997 .

Fault localisation in ICs by goniometric laser probing of thermal induced surface waves

Antonio Rubio, Josep Altet, Stefan Dilhaire, 1999 .

Four different approaches for the measurement of IC surface temperature: application to thermal testing

Antonio Rubio, Josep Altet, Wilfrid Claeys, 2002 .

Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers

Wilfrid Claeys, Sebastian Volz, Stéphane Grauby, 2005 .

A heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits

E. Aldrete-Vidrio, Miquel Vellvehi, Diego Mateo, 2008 .

Thermomechanical study of AlCu based interconnect under pulsed thermoelectric excitation

Dean Lewis, Stefan Dilhaire, Wilfrid Claeys, 1997 .

Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging technique.

Stefan Dilhaire, Wilfrid Claeys, Stéphane Grauby, 2003, Applied optics.

Optical method for the measurement of the thermomechanical behaviour of electronic devices

Alain Cornet, Stefan Dilhaire, Wilfrid Claeys, 1999 .

Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions

Stefan Dilhaire, Wilfrid Claeys, Stéphane Grauby, 2004 .

Laser beam thermography of circuits in the particular case of passivated semiconductors

G. Deboy, Dean Lewis, Stefan Dilhaire, 1996 .