Priyanka Bakliwal

Disturbance-free BIST for loop characterization of DC-DC buck converters

Sule Ozev, Bertan Bakkaloglu, Navankur Beohar, 2015, 2015 IEEE 33rd VLSI Test Symposium (VTS).

A Disturbance-Free Built-In Self-Test and Diagnosis Technique for DC-DC Converters

Sule Ozev, Bertan Bakkaloglu, Maryam Shafiee, 2017, TODE.