Philippe Adell

Disturbance-free BIST for loop characterization of DC-DC buck converters

Sule Ozev, Bertan Bakkaloglu, Navankur Beohar, 2015, 2015 IEEE 33rd VLSI Test Symposium (VTS).

A digitally controlled DC-DC buck converter with lossless load-current sensing and BIST functionality

Tao Liu, Bertan Bakkaloglu, Philippe Adell, 2011, 2011 IEEE International Solid-State Circuits Conference.