J. Jimenez
发表
Martin Kuball,
J. Pomeroy,
N. Killat,
2014
.
C. Campbell,
Shuoqi Chen,
M. Kao,
2015
.
A. Arehart,
J. Jimenez,
W. Sun,
2020,
IEEE Electron Device Letters.
U. Chowdhury,
J. Jimenez,
2009,
2009 Reliability of Compound Semiconductors Digest (ROCS).
H. Tserng,
J. Joh,
T. Chou,
2007,
2007 ROCS Workshop[Reliability of Compound Semiconductors Digest].
Jose L. Jimenez,
Martin Kuball,
Uttiya Chowdhury,
2012,
Microelectron. Reliab..
J.A. del Alamo,
Jungwoo Joh,
Tso-Min Chou,
2009,
IEEE Transactions on Electron Devices.
Paul Saunier,
Jose L. Jimenez,
Cathy Lee,
2009,
Microelectron. Reliab..
Seong-Yong Park,
J.A. del Alamo,
P. Saunier,
2008,
IEEE Electron Device Letters.
U. Chowdhury,
J.L. Jimenez,
U. Chowdhury,
2008,
2008 IEEE International Reliability Physics Symposium.
M. Shur,
P. Saunier,
A. Balistreri,
2007,
2007 65th Annual Device Research Conference.
Yu Cao,
Dennis E. Walker,
Andrew J. Green,
2019,
IEEE Electron Device Letters.
J.A. del Alamo,
J. D. del Alamo,
J. Joh,
2008,
IEEE Electron Device Letters.
N. Killat,
U. Chowdhury,
M. Kuball,
2010,
2010 IEEE International Reliability Physics Symposium.
M. Kuball,
Martin Kuball,
J. Pomeroy,
2013,
2013 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS).
Quiescent Drain Voltage Dependence of Pulsed I-V Characteristics of GaN HEMTs: Analysis and Modeling
L. Dunleavy,
S. Khandelwal,
J. Jimenez,
2019,
2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS).
E. Beam,
A. Ketterson,
A. Xie,
2020,
2020 IEEE/MTT-S International Microwave Symposium (IMS).
C. Campbell,
Shuoqi Chen,
Vipan Kumar,
2020,
2020 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).
Michael S. Shur,
P. C. Chao,
Alexey Koudymov,
2008
.