Kazunari Ishimaru

发表

Process dependence of 1/f noise : For realization of high performance analog circuits

Kazuya Matsuzawa, K. Kojima, Tatsuya Ohguro, 2003 .

Atsushi Kawasumi, A. Suzuki, Kazunari Ishimaru, 1996 .

Film composition and its profile control of hfsion for poly-Su gate cmosfet with high performance and reliability

Yoshitaka Tsunashima, Motoyuki Sato, Takashi Watanabe, 2005 .

Non-Volatile Memory Technology for Data Age

Kazunari Ishimaru, 2018, 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT).

Combination of TCAD and physical MOSFET model for LSI development time reduction

Kohji Hashimoto, F. Matsuoka, Kazunari Ishimaru, 2000, 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072).

Bipolar installed CMOS technology without any process step increase for high speed cache SRAM

Kazunari Ishimaru, Masakazu Kakumu, Fumiyoshi Matsuoka, 1995, Proceedings of International Electron Devices Meeting.

Ultra-Thin Body and BOX (UTBB) Device for Aggressive Scaling of CMOS Technology

Nicolas Loubet, Ali Khakifirooz, Maud Vinet, 2011 .

Scaled CMOS with SiON and high-k

Daisuke Matsushita, M. Fujiwara, Kazunari Ishimaru, 2006 .

Low-power logic circuit and SRAM cell applications with silicon on depletion Layer CMOS (SODEL CMOS) technology

Ichiro Mizushima, Hidemi Ishiuchi, Yasunori Okayama, 2006, IEEE Journal of Solid-State Circuits.

High-Density Full-CMOS SRAM Cell Technology with a Deep Sub-Micron Spacing between nMOS and pMOSFET (Special Section on High Speed and High Density Multi Functional LSI Memories)

Toshiyuki Kondo, Kazunari Ishimaru, Hidetoshi Koike, 1994 .

Guest Editorial Special Section on the Second Electron Devices Technology and Manufacturing (EDTM) Conference 2018

Paul R. Berger, Kazunari Ishimaru, Naoto Horiguchi, 2018 .

A reverse base current under high level injection and its influence on BiCMOS circuit

M. Matsui, T. Maeda, Hisayo Sasaki Momose, 1991, International Electron Devices Meeting 1991 [Technical Digest].

SESSION 9 Advanced Transistor Technology II

David M. Fried, T. Fukai, Hiroyuki Mizuno, 2004 .

Challenges of Flash Memory for Next Decade

Kazunari Ishimaru, K. Ishimaru, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).

High-resolution characterization of ultrashallow junctions by measuring in vacuum with scanning spreading resistance microscopy

Kazuya Ohuchi, Kazunari Ishimaru, Akira Nishiyama, 2007 .

An intelligent bipolar actuation method with high stiction immunity for RF MEMS capacitive switches and variable capacitors

Hidemi Ishiuchi, Tatsuya Ohguro, Kazunari Ishimaru, 2007 .