K. Kashihara
发表
K. Maekawa,
K. Asai,
T. Okudaira,
2006,
2006 International Workshop on Junction Technology.
K. Nakamae,
T. Yamaguchi,
K. Kashihara,
2014
.
T. Eimori,
Y. Hashizume,
K. Arimoto,
1994,
Proceedings of 1994 VLSI Technology Symposium.
H. Oda,
T. Yamashita,
J. Komori,
2010
.
K. Asai,
T. Okudaira,
T. Yamaguchi,
2009
.
K. Asai,
T. Okudaira,
T. Yamaguchi,
2008
.
F. Shoji,
K. Oura,
T. Hanawa,
1990
.
F. Shoji,
K. Oura,
K. Sumitomo,
1991
.
K. Asai,
S. Sakamori,
T. Okudaira,
2008,
Extended Abstracts - 2008 8th International Workshop on Junction Technology (IWJT '08).
K. Kashihara,
T. Yamaguchi,
T. Futase,
2009,
2009 IEEE International Reliability Physics Symposium.
K. Asai,
T. Okudaira,
T. Yamaguchi,
2010
.
K. Asai,
K. Maekawa,
K. Kashihara,
2008,
IEEE International Reliability Physics Symposium.
K. Asai,
T. Okudaira,
J. Tsuchimoto,
2006,
2006 International Electron Devices Meeting.
K. Asai,
T. Yamaguchi,
K. Maekawa,
2010,
Micron.
K. Asai,
T. Okudaira,
J. Tsuchimoto,
2009,
IEEE Transactions on Electron Devices.
K. Nakamae,
K. Asai,
T. Yamaguchi,
2014,
IEEE Transactions on Semiconductor Manufacturing.
K. Asai,
H. Oda,
T. Okudaira,
2007,
2007 IEEE International Electron Devices Meeting.
Yoichi Akasaka,
Katsuhiro Tsukamoto,
T. Okudaira,
1991,
International Electron Devices Meeting 1991 [Technical Digest].
K. Asai,
T. Okudaira,
T. Yamaguchi,
2010
.
T. Nishimura,
T. Horikawa,
T. Okudaira,
1995
.
T. Okudaira,
M. Matsushita,
H. Miyoshi,
1998,
International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217).