Jin-Suk Wang

发表

Novel NiSi technology utilizing Ti/Ni/TiN structure and fluorine implantation for thermal stability improvement by suppression of abnormal oxidation

H. Lee, J. Yun, Soon-Young Oh, 2004, The Fourth International Workshop on Junction Technology, 2004. IWJT '04..

Thermal Stability improvement of Nickel Germanosilicide Utilizing Ni-Ta Alloy and Co/TiN Cappling layer for Nano-scale CMOS Technology

H. Lee, Ying-Ying Zhang, Yong-Jin Kim, 2006, 2006 International Workshop on Junction Technology.

Ni Germanide Utilizing Ytterbium Interlayer for High-Performance Ge MOSFETs

H. Lee, Ga-Won Lee, Jungwoo Oh, 2009 .

Thermally Robust Nickel Silicide Process for Nano-Scale CMOS Technology

Yong-Jin Kim, Soon-Young Oh, Hi-Deok Lee, 2005, IEICE Trans. Electron..

Influence of Incorporating Rare Earth Metals on the Schottky Barrier Height of Ni Silicide

H. Lee, Jungwoo Oh, P. Majhi, 2010 .

Characterization of Surface Morphology and Light Scattering of Transparent Conducting ZnO:Al Films as Front Electrode for Silicon Thin Film Solar Cells

Young-Jin Kim, K. Yoon, J. Cho, 2009 .

Highly Thermal Immune Nitrogen-Doped Ni–Germanosilicide with Co/TiN Double Layer for Nano-Scale Complementary Metal Oxide Semiconductor Applications

H. Lee, Yong-Jin Kim, J. Yun, 2006 .

Microstructural Innovation of Ni Germanide on Ge-on-Si Substrate by Using Palladium Incorporation

H. Lee, Ga-Won Lee, Chel-Jong Choi, 2009 .

Study on palladium germanide on Ge-on-Si substrate for nanoscale Ge channel Schottky barrier MOSFETs

H. Lee, Ga-Won Lee, Ying-Ying Zhang, 2010, 2010 International Workshop on Junction Technology Extended Abstracts.

Study of Ni-germano Silicide Thermal Stability for Nano-scale CMOS Technology

H. Lee, Yong-Jin Kim, J. Yun, 2004 .

Effect of texture morphology on the surface passivation and a-Si/c-Si heterojunction solar cells

K. Yoon, S. H. Park, J. Cho, 2009, 2009 34th IEEE Photovoltaic Specialists Conference (PVSC).

Effect of Cleaning Processes of Silicon Wafer on Surface Passivation and a-Si:H/c-Si Hetero-Junction Solar Cell Performances

J. Cho, Jinsoo Song, D. Jeong, 2010 .

The Effect of Triple Capping Layer ( Ti ∕ Ni ∕ TiN ) on the Electrical and Structural Properties of Nickel Monosilicide

H. Lee, Chel-Jong Choi, R. Jung, 2006 .

Abnormal Oxidation of Nickel Silicide on N-Type Substrate and Effect of Preamorphization Implantation

H. Lee, T. Bae, J. Yun, 2004 .

Characterization of the Dopant Dependence of Ni-Silicide on a SOI Substrate for a Nano-Scale CMOSFET

H. Lee, Ga-Won Lee, Ying-Ying Zhang, 2007 .

Work function variation of nickel silicide using an ytterbium buffer layer for Schottky barrier metal-oxide-semiconductor field-effect transistors

H. Lee, Ga-Won Lee, Ying-Ying Zhang, 2007 .

Novel Nitrogen Doped Ni Self-Alingned Silicide Process for Nanoscale Complementary Metal Oxide Semiconductor Technology

H. Lee, Yong-Jin Kim, J. Yun, 2005 .

Electrical and Physical Characteristics of Nickel Silicide using Rare-Earth Metals

Yong-Jin Kim, Soon-Yen Jung, Jin-Suk Wang, 2008 .

Characterization of Nickel-Silicide Dependence on the Substrate Dopants for Nanoscale Complementary Metal Oxide Semiconductor Technology

H. Lee, J. Yun, Soon-Young Oh, 2004 .

Stress Dependence of Thermal Stability of Nickel Silicide for Nano MOSFETs

H. Lee, Ga-Won Lee, Ying-Ying Zhang, 2007 .

Thermal Stable Nickel Silicide Utilizing Ni/Co/Ni/TiN structure and Two-Step RTP on Doped Substrate

H. Lee, Ga-Won Lee, Ying-Ying Zhang, 2007, 2007 International Workshop on Junction Technology.

Influence of the Annealing Ambient on the Thermal Stability of Ni Silicide for nano-scale CMOSFETs

H. Lee, Soon-Young Oh, Jin-Suk Wang, 2006, 2006 International Workshop on Junction Technology.

Abnormal oxidation of NiSi formed on arsenic-doped substrate

H. Lee, J. Yun, Soon-Young Oh, 2004 .

Effect of Si capping layer on the interface quality and NBTI of high mobility channel Ge-on-Si pMOSFETs

H. Lee, B. Lee, C. Kang, 2009 .

On-chip charge pumping method for characterization of interface states of ultra thin gate oxide in nano CMOS technology

H. Lee, Kyungmin Kim, I. Cho, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..