W. Riordan

Reliability improvement and burn in optimization through the use of die level predictive modeling

E.R. St Pierre, W.C. Riordan, R. Miller, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..

Reliability versus yield and die location in advanced VLSI

W. C. Riordan, R. Miller, J. Hicks, 1999 .