E. Levine

Electromigration Induced Damage and Structure Change in Cr-Al/Cu and Al/Cu Interconnection Lines

E. Levine, J. Kitcher, 1984, 22nd International Reliability Physics Symposium.

Analysis of Thermal Cycle Fatigue Damage in Microsocket Solder Joints

E. Levine, J. Ordonez, E. Levine, 1981 .