Tetsuo Takahashi

A simple and effective carrier lifetime evaluation method with diode test structures in IGBT

S. Aono, A. Uenishi, M. Harada, 1997, Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's.

CSTBT™(III) having wide SOA under high temperature condition

Tomohide Terashima, Yusuke Fukada, Tatsuo Harada, 2011, 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs.