S. Aoyama

Standardized procedure for calibrating height scales in atomic force microscopy on the order of 1 nm

Y. Suzuki, Mineharu Suzuki, T. Osada, 1996 .

In situ substrate surface cleaning by low‐energy ion bombardment for high quality thin film formation

Tadahiro Ohmi, T. Ohmi, S. Aoyama, 1993 .