Z. Huszka

Extraction of the emitter related space charge weighting factor parameters of HICUM L2.30 using the Lambert W function

D. Celi, F. Stein, Z. Huszka, 2012, 2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).

Extraction procedure for emitter series resistance contributions in SiGeC BiCMOS technologies

D. Celi, F. Stein, Z. Huszka, 2014, 2014 International Conference on Microelectronic Test Structures (ICMTS).

An extended two-port method for the determination of the base and emitter resistance

E. Seebacher, Z. Huszka, W. Pflanzl, 2005, Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005..

Verilog-A modeling of BJT NQS excess phase

C.C. McAndrew, Z. Huszka, G. Coram, 2008, 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.

Bipolar Transistor Excess Phase Modeling in Verilog-A

C.C. McAndrew, Z. Huszka, G.J. Coram, 2009, IEEE Journal of Solid-State Circuits.

Analog Compact Modeling for a 20-120V HV CMOS Technology

B. Senapati, E. Seebacher, Z. Huszka, 2006 .

Improvement of differential planar spiral inductors on a 0.35/spl mu/m BiCMOS process

G. Magerl, E. Seebacher, Z. Huszka, 2005, 2005 European Microwave Conference.

AnExtended Two-Port MethodfortheDetermination oftheBaseandEmitter Resistance

E. Seebacher, Z. Huszka, 2005 .

Improving parasitic emitter resistance determination methods for advanced SiGe:C HBT transistors

Z. Huszka, B. Ardouin, B. Ardouin, 2011, 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting.

3-port characterization of differential inductors

Z. Huszka, 2004, Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting.