I Petrov

Sublimation of atomic layers from a chromium surface.

C. P. Flynn, S. Kodambaka, I. Petrov, 2006, Physical review letters.

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

E A Kenik, M Stekelenburg, U Dahmen, 2008, Microscopy and Microanalysis.