N. Yacoubi

Current instabilities and deep level investigation on AlGaN/GaN HEMT's on silicon and sapphire substrates

C. Gaquiere, A. Souifi, N. Sghaier, 2004, Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004..

Determination of very thin semiconductor layer thickness by a photothermal method

C. Alibert, N. Yacoubi, N. Yacoubi, 1991 .

IR characterization of graphite black-coating for cryogenic detectors

N. Yacoubi, I. Mellouki, N. Yacoubi, 2007 .