S.C. Chin

An Electrical Failure Analysis (EFA) Flow to Quantitatively Identify Invisible Defect on Individual Transistor: Using the Characterization of Random Dopant Fluctuation (RDF) as an Example

Y.M. Liu, J.H. Lee, Y.M. Shcu, 2018, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

The impact of SOI MOSFETs on low power digital circuits

Ying-Che Tseng, J.C.S. Woo, S.C. Chin, 1997, Proceedings of 1997 International Symposium on Low Power Electronics and Design.