M. Acciarri

The L3 siliconmicrovertexdetector Dedicatedtothememory ofVanko Krastevandhisfamily.

Andrea Baschirotto, Rinaldo Castello, L. Djambazov, 1994 .

A European thin-film tandem device proficiency test - Practical outcomes and preliminary results

Suren A. Gevorgyan, Harald Müllejans, Wilhelm Warta, 2019 .

EBIC, EBSD and TEM study of grain boundaries in multicrystalline silicon cast from metallurgical feedstock

M. Acciarri, R. Holmestad, J. Walmsley, 2008, 2008 33rd IEEE Photovoltaic Specialists Conference.

Influence of Cu content on electronic transport and shunting behavior of Cu(In,Ga)Se2 solar cells

Alessandro Virtuani, M. Acciarri, Uwe Rau, 2006 .

Detection of junction failures and other defects in silicon and III–v devices using the LBIC technique in lateral configuration

M. Acciarri, S. Pizzini, Simona Binetti, 1996 .