J.A. Romagnoli

Line Edge Detection and Characterization in SEM Images Using Wavelets

A. Palazoglu, Wei Sun, J.A. Romagnoli, 2009, IEEE Transactions on Semiconductor Manufacturing.

On the use of gap metric for model selection in multilinear model-based control

Y. Arkun, A. Palazoglu, Y. Arkun, 2000, Proceedings of the 2000 American Control Conference. ACC (IEEE Cat. No.00CH36334).