A.J.B. de Oliveira

Frequency shifting using corrugated coupled microstrip lines

P.N.S. Filho, A.L. Bezzera, A.J.B. de Oliveira, 2005, SBMO/IEEE MTT-S International Conference on Microwave and Optoelectronics, 2005..

A single six-port reflectometer measures the scattering parameters of two-port microwave devices

A.J.B. de Oliveira, S.P.X. Neto, A. D. de Oliveira, 1995, Proceedings of 1995 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference.

Measuring complex permittivity with the six-port technique

A.J.B. de Oliveira, M.T. de Melo, A.L.D.S. Rolim, 2005, SBMO/IEEE MTT-S International Conference on Microwave and Optoelectronics, 2005..