A. Bousetta

Improving defect capture rate for excursion detection

L. Lin, S. Chen, A. Bousetta, 2005 .

Comparative study of two KLA-Tencor advanced patterned wafer inspection systems

A. Bousetta, S. Rowley, S. Thorne, 2000, 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072).

Formation of carbon nitride films on Si(100) substrates by electron cyclotron resonance plasma assisted vapor deposition

A. Bousetta, Abdelhak Bensaoula, A. Bensaoula, 1994 .

Electrical properties of boron nitride thin films grown by neutralized nitrogen ion assisted vapor deposition

A. Bousetta, Abdelhak Bensaoula, J. A. Schultz, 1996 .