S. Beebe

SOI lateral diode optimization for ESD protection in 130nm and 90nm technologies

G. Gilfeather, M. Pelella, G. Gilfeather, 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

ESD protection for SOI technology using an under-the-box (substrate) diode structure

N. Subba, M. Pelella, N. Subba, 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.