J. M. Lenssinck

发表

Evidence for tip imaging in scanning tunneling microscopy

E. J. van Loenen, D. Dijkkamp, J. Dieleman, 1990 .

Carbon removal from as‐received Si samples in ultrahigh vacuum using ultraviolet light and an ozone beam

E. Loenen, J. M. Lenssinck, D. Dijkkamp, 1991 .

Reflection high energy electron diffraction and scanning tunnelling microscopy study of single-domain growth during silicon molecular beam epitaxy on Si(001)

J. Dieleman, E. Loenen, J. M. Lenssinck, 1989 .

Nanometer scale structuring of silicon by direct indentation

J. Dieleman, E. Loenen, J. M. Lenssinck, 1990 .

Direct writing in Si with a scanning tunneling microscope

J. Dieleman, E. Loenen, J. M. Lenssinck, 1989 .

Scanning tunneling microscopy study of initial stages of silicon molecular beam epitaxy

E. Loenen, J. M. Lenssinck, D. Dijkkamp, 1990 .

Island and step structures on molecular beam epitaxy grown Si(001) surfaces

J. Dieleman, E. Loenen, J. M. Lenssinck, 1990 .

Si Molecular Beam Epitaxy: A Comparison of Scanning Tunneling Microscopy Observations with Computer Simulations

H. B. Elswijk, J. Dieleman, E. Loenen, 1990 .

Morphology and distribution of atomic steps on Si (001) studied with scanning tunneling microscopy

J. Dieleman, E. Loenen, J. M. Lenssinck, 1990 .