Naoyuki Nishikawa

Direct observation of changes in the effective minority-carrier lifetime of SiNx-passivated n-type crystalline-silicon substrates caused by potential-induced degradation and recovery tests

Naoyuki Nishikawa, Seira Yamaguchi, Keisuke Ohdaira, 2017, Microelectron. Reliab..

Light receiving unit

Naoyuki Nishikawa, Shinji Kirihata, Toshiyuki Suzuki, 1999 .