P. Ferreira

Scalable and maximally-permissive deadlock avoidance for FMS

P. Kumar, K. Kothandaraman, P. Ferreira, 1998, Proceedings. 1998 IEEE International Conference on Robotics and Automation (Cat. No.98CH36146).

Validated 90nm CMOS technology platform with low-k copper interconnects for advanced system-on-chip (SoC)

Michel Haond, Sylvie Naudet, David Roy, 2002, Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT2002).

Improving Ge-rich GST ePCM reliability through BEOL engineering

Paolo Mattavelli, Daniele Ielmini, David Turgis, 2021, ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC).

16MB High Density Embedded PCM macrocell for automotive-grade microcontroller in 28nm FD-SOI, featuring extension to 24MB for Over-The-Air software update

F. Disegni, D. Manfrè, C. Torti, 2021, 2021 Symposium on VLSI Circuits.

32nm general purpose bulk CMOS technology for high performance applications at low voltage

S. Samavedam, M. Sherony, F. Arnaud, 2008, 2008 IEEE International Electron Devices Meeting.

A Cost-Effective Low Power Platform for the 45-nm Technology Node

R. Ranica, O. Callen, M. Haond, 2006, 2006 International Electron Devices Meeting.

Manufacturability and Speed Performance Demonstration of Porous ULK (k=2.5) for a 45nm CMOS Platform

M. Haond, P. Ferreira, C. Cregut, 2007, 2007 IEEE Symposium on VLSI Technology.