J. M. Soden

发表

Edward I. Cole, Richard E. Anderson, J. M. Soden, 1995, Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits.

J. M. Soden, C. F. Hawkins, C. Hawkins, 1995, Proceedings of the IEEE 1995 Custom Integrated Circuits Conference.

M. R. Taylor, C. F. Hawkins, R. K. Treece, 1989 .

Charles F. Hawkins, J. M. Soden, 1996 .

J. M. Soden, C. L. Henderson, 1996 .

J. M. Soden, C. L. Henderson, Edward I. Cole, 1999 .

Jeremy A. Walraven, Paiboon Tangyunyong, Danelle M. Tanner, 2000, SPIE MOEMS-MEMS.

Jaume Segura, Charles F. Hawkins, J. M. Soden, 2006 .

Richard E. Anderson, J. M. Soden, C. L. Henderson, 1995 .

J. M. Soden, C. L. Henderson, 1991, 29th Annual Proceedings Reliability Physics 1991.

Kenneth A. Peterson, Ann N. Campbell, J. M. Soden, 1995 .

Richard E. Anderson, J. M. Soden, C. L. Henderson, 1995 .

Charles F. Hawkins, J. M. Soden, 1993 .

Paiboon Tangyunyong, Edward I. Cole, Charles F. Hawkins, 2003, The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003..

F. J. Ferguson, Charles F. Hawkins, J. M. Soden, 1995 .

Ali Keshavarzi, Charles F. Hawkins, J. M. Soden, 1997 .

R. E. Anderson, J. M. Soden, 1998 .

Edward I. Cole, Ann N. Campbell, J. M. Soden, 1994 .

J. M. Soden, C. F. Hawkins, C. Hawkins, 1989, [1989] Proceedings of the 1st European Test Conference.

J. M. Soden, H. D. Stewart, R. A. Pastorek, 1983 .

Charles F. Hawkins, J. M. Soden, R. R. Fritzemeier, 1989 .

D. P. Vallett, J. M. Soden, 1997 .

Edward I. Cole, J. M. Soden, C. L. Henderson, 1994 .

F. J. Low, D. L. Barton, J. M. Soden, 1996 .

Jeremy A. Walraven, Paiboon Tangyunyong, Alejandro A. Pimentel, 2006 .

Kenneth A. Peterson, Ann N. Campbell, J. M. Soden, 1997, 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual.

J. M. Soden, P. V. Dressendorfer, J. J. Harrington, 1981, IEEE Transactions on Nuclear Science.

D. M. Tanner, Diane K. Stewart, Ann N. Campbell, 1997 .

Edward I. Cole, J. M. Soden, C. L. Henderson, 1994, Proceedings of 1994 IEEE International Reliability Physics Symposium.

J. M. Soden, E. I. Cole, 1992 .