X. Garros
发表
X. Garros,
D. Bosch,
G. Cibrario,
2019,
2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).
X. Garros,
J. Cluzel,
F. Cacho,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
X. Garros,
O. Faynot,
F. Andrieu,
2011,
2011 Symposium on VLSI Technology - Digest of Technical Papers.
X. Garros,
O. Faynot,
C. Laviron,
2008,
ESSDERC 2008 - 38th European Solid-State Device Research Conference.
X. Garros,
J. Mazurier,
M. Rafik,
2016,
2016 IEEE Symposium on VLSI Technology.
X. Garros,
C. Leroux,
F. Martin,
2004,
2004 IEEE International Reliability Physics Symposium. Proceedings.
X. Garros,
S. Deleonibus,
C. Leroux,
2002,
Digest. International Electron Devices Meeting,.
X. Garros,
A. Toffoli,
G. Reimbold,
2014
.
A. Subirats,
X. Garros,
J. El Husseini,
2014,
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.
Guidelines to improve mobility performances and BTI reliability of advanced high-k/metal gate stacks
X. Garros,
G. Reimbold,
C. Leroux,
2008,
2008 Symposium on VLSI Technology.
X. Garros,
Claire Fenouillet-Beranger,
D. Bosch,
2020
.
X. Garros,
G. Ghibaudo,
P. Batude,
2018,
2018 IEEE Symposium on VLSI Technology.
A. Subirats,
X. Garros,
J. El Husseini,
2014,
2014 International Conference on Microelectronic Test Structures (ICMTS).
X. Garros,
Emmanuel Augendre,
M. Vinet,
2008
.
A. Subirats,
X. Garros,
J. El Husseini,
2014,
2014 IEEE International Reliability Physics Symposium.
X. Garros,
G. Cibrario,
P. Batude,
2016,
2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).
X. Garros,
G. Reimbold,
O. Faynot,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
Interface states in HfO/sub 2/ stacks with metal gate: nature, passivation, generation [MOS devices]
X. Garros,
G. Reimbold,
C. Leroux,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
X. Garros,
G. Reimbold,
F. Andrieu,
2009
.
X. Garros,
G. Reimbold,
T. Salvetat,
2008,
2008 IEEE International Reliability Physics Symposium.
X. Garros,
D. Bosch,
G. Cibrario,
2019,
2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).
X. Garros,
P. Batude,
S. Deleonibus,
2007
.
X. Garros,
O. Faynot,
P. Batude,
2010,
2010 Symposium on VLSI Technology.
X. Garros,
G. Reimbold,
C. Fenouillet-Beranger,
2009,
2009 IEEE International Reliability Physics Symposium.
X. Garros,
O. Faynot,
F. Andrieu,
2007,
ESSDERC 2007 - 37th European Solid State Device Research Conference.
X. Garros,
J. Mazurier,
O. Faynot,
2012,
Proceedings of Technical Program of 2012 VLSI Technology, System and Application.
Gate-last integration on planar FDSOI MOSFET: Impact of mechanical boosters and channel orientations
X. Garros,
O. Faynot,
F. Andrieu,
2013,
2013 IEEE International Electron Devices Meeting.
X. Garros,
S. Deleonibus,
C. Tabone,
2005,
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..
X. Garros,
O. Rozeau,
O. Faynot,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
X. Garros,
S. Deleonibus,
Gerard Ghibaudo,
2009,
ESSDERC 2009.
X. Garros,
O. Faynot,
F. Andrieu,
2011,
2011 IEEE International Conference on IC Design & Technology.
X. Garros,
J. Mazurier,
O. Rozeau,
2010,
2010 International Electron Devices Meeting.
X. Garros,
G. Reimbold,
G. Ghibaudo,
2004,
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..
X. Garros,
O. Faynot,
Yves Campidelli,
2007
.
X. Garros,
O. Faynot,
D. Noblet,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
X. Garros,
G. Ghibaudo,
M. Rafik,
2007,
2007 IEEE International Electron Devices Meeting.
X. Garros,
O. Faynot,
M. Vinet,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
X. Garros,
O. Rozeau,
G. Ghibaudo,
2020,
2020 IEEE Symposium on VLSI Technology.
X. Garros,
G. Reimbold,
D. Blin,
2002,
32nd European Solid-State Device Research Conference.
X. Garros,
O. Faynot,
T. Ernst,
2009,
IEEE Transactions on Electron Devices.
X. Garros,
G. Reimbold,
Emmanuel Augendre,
2009
.
X. Garros,
O. Faynot,
F. Andrieu,
2006,
2006 International Electron Devices Meeting.
X. Garros,
G. Reimbold,
G. Ghibaudo,
2016,
2016 IEEE Symposium on VLSI Technology.
X. Garros,
C. Leroux,
T. Skotnicki,
2002,
Digest. International Electron Devices Meeting,.
X. Garros,
Laurent Vandroux,
Pascal Besson,
2007
.
X. Garros,
O. Rozeau,
O. Faynot,
2006,
2009 Symposium on VLSI Technology.
X. Garros,
M. Rafik,
A. Bravaix,
2010,
2010 International Electron Devices Meeting.
X. Garros,
P. Batude,
M. Vinet,
2014,
2014 IEEE International Electron Devices Meeting.
X. Garros,
G. Ghibaudo,
M.-P. Samson,
2017,
2017 IEEE International Electron Devices Meeting (IEDM).
X. Garros,
G. Reimbold,
O. Faynot,
2010,
2010 Symposium on VLSI Technology.
X. Garros,
G. Ghibaudo,
D. Bosch,
2020,
2020 IEEE Symposium on VLSI Technology.
X. Garros,
P. Batude,
M. Vinet,
2018,
2018 IEEE International Electron Devices Meeting (IEDM).
X. Garros,
G. Reimbold,
G. Ghibaudo,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.