Maggie Yamin Huang

Evidence of ultra-low-k dielectric material degradation and nanostructure alteration of the Cu/ultra-low-k interconnects in time-dependent dielectric breakdown failure

Fan Zhang, Jeffrey Lam, Zexiang Shen, 2013 .

Fourier Transform Infrared Spectroscopy of Low-k Dielectric Material on Patterned Wafers

Handong Sun, Zexiang Shen, Z. Mai, 2012 .

Vibrational spectroscopy of low-k/ultra-low-k dielectric materials on patterned wafers

Handong Sun, Choun Pei Wong, Zexiang Shen, 2011 .

Fourier Transform Infrared Spectroscopy of Low-k Dielectric Material on Patterned Wafers

Handong Sun, Zexiang Shen, Z. Mai, 2012 .

UV-Raman Microscopy on the Analysis of Ultra-Low-K Dielectric Materials on Patterned Wafers

M. K. Dawood, Z. Mai, J. Lam, 2013 .

Structure and composition of the Cu/low k interconnects de-layered with FIB

P. K. Tan, Z. Mai, J. Lam, 2014, Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Structural and composition investigations at delayered locations of low k integrated circuit device by gas-assisted focused ion beam

D. D. Wang, P. K. Tan, J. Lam, 2014 .

Study of Si nanocrystal growth and characterization for Si nanocrystal embeded nonvolatile memory

P. K. Tan, Z. Mai, J. Lam, 2017, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Enhancement of Raman signals from low-k dielectrics with angle-resolved light scattering on nanostructure patterned Cu/low-k interconnects of IC devices

P. K. Tan, J. Lam, Maggie Yamin Huang, 2015 .