B. Kiran Kumar

发表

Parag K. Lala, B. Kiran Kumar, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Parag K. Lala, B. Kiran Kumar, James Patrick Parkerson, 2006, Microelectron. J..

Parag K. Lala, B. Kiran Kumar, 2002, Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002).

Parag K. Lala, B. Kiran Kumar, 2003, J. Electron. Test..

Parag K. Lala, B. Kiran Kumar, 2002, Proceedings International Symposium on Quality Electronic Design.