R. Zhang

Detection of via electromigration in VLSI circuit metallizations by 1/f noise measurements

Z. Çelik-Butler, R. Zhang, 2008 .

1/f noise and electromigration in multilayered via structures

Z. Çelik-Butler, R. Zhang, N. Patel, 1996 .

IN MEMORIAM PROF. ANDRÁS AMBRÓZY IN PHYSICAL SYSTEMS

R. Zhang, I. Mojzes, 2022 .

Ultrafast multi-cycle terahertz measurements of the electrical conductivity in strongly excited solids

S. Bajt, S. Hau-Riege, S. Glenzer, 2021, Nature Communications.

Investigation on thermo-mechanical responses in high power multi-finger AlGaN/GaN HEMTs

R. Zhang, Wen-Sheng Zhao, W. Y. Yin, 2014, Microelectronics and reliability.

Stochastic p-Bits Based on Spin-Orbit Torque Magnetic Tunnel Junctions

X. Li, C. Wan, R. Zhang, 2023, 2306.02780.