M. Kouda

发表

H. Iwai, T. Hattori, N. Sugii, 2009, 2009 Proceedings of the European Solid State Device Research Conference.

H. Iwai, K. Pey, K. Kakushima, 2010, 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

Hiroshi Iwai, Nobuyuki Sugii, Kuniyuki Kakushima, 2010 .

K. Kakushima, H. Iwai, Z. R. Wang, 2011, 2011 International Reliability Physics Symposium.

Hiroshi Iwai, Nobuyuki Sugii, Kuniyuki Kakushima, 2010, Microelectron. Reliab..