M. Kouda
发表
H. Iwai,
T. Hattori,
N. Sugii,
2009,
2009 Proceedings of the European Solid State Device Research Conference.
H. Iwai,
N. Sugii,
H. Iwai,
2012
.
T. Hattori,
N. Sugii,
A. Nishiyama,
2010
.
H. Iwai,
K. Pey,
K. Kakushima,
2010,
2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.
Hiroshi Iwai,
Nobuyuki Sugii,
Kuniyuki Kakushima,
2010
.
H. Iwai,
T. Yasuda,
P. Ahmet,
2011
.
T. Hattori,
N. Sugii,
A. Nishiyama,
2011
.
H. Iwai,
T. Hattori,
N. Sugii,
2011
.
H. Iwai,
T. Yasuda,
P. Ahmet,
2012
.
H. Iwai,
Nobuyuki Sugii,
Kuniyuki Kakushima,
2012
.
Hiroshi Iwai,
Nagarajan Raghavan,
Kuniyuki Kakushima,
2011
.
Hiroshi Iwai,
Kuniyuki Kakushima,
Michel Bosman,
2014
.
K. Kakushima,
H. Iwai,
Z. R. Wang,
2011,
2011 International Reliability Physics Symposium.
Hiroshi Iwai,
Nobuyuki Sugii,
Kuniyuki Kakushima,
2010,
Microelectron. Reliab..