K. Miura

THz emission characteristics from p/n junctions with metal lines under non-bias conditions for LSI failure analysis.

Masatsugu Yamashita, Chiko Otani, Hironaru Murakami, 2011, Optics express.

Automatic EB fault-tracing system using fuzzy-logic approach

H. Fujioka, K. Nakamae, K. Miura, 2000 .

Rotation vector analysis of eye movement in three dimensions with an infrared CCD camera.

K Nakamae, H. Fujioka, K. Nakamae, 1999, Acta oto-laryngologica.

Boundary extraction in the SEM cross-section of LSI

Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae, 2001, SPIE Optics East.

Comparing the accuracy of video-oculography and the scleral search coil system in human eye movement analysis.

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka, 2005, Auris, nasus, larynx.

Intelligent EB test system for automatic VLSI fault tracing

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka, 1999, Proceedings Eighth Asian Test Symposium (ATS'99).

Automatic fault tracing by successive circuit extraction from CAD layout data with the CAD-linked EB test system

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka, 1998 .

Automatic EB fault tracing system by successive circuit extraction from VLSI CAD layout data

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka, 1997, Proceedings Sixth Asian Test Symposium (ATS'97).

Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka, 1997, J. Electron. Test..

Hierarchical fault tracing for VLSI sequential circuits from CAD layout data in the CAD-linked EB test system

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka, 1997, Proceedings of ASP-DAC '97: Asia and South Pacific Design Automation Conference.