C. Bohm

Electric force microscopy: gigahertz and nanometer measurement tool

C. Bohm, 1996 .

Diagnosis in submicron integrated circuits by electric force microscopy

E. Kubalek, J. Sprengepiel, C. Bohm, 1996 .

Scanning-force-microscope test system for device internal test with high spatial and temporal resolution

E. Kubalek, C. Bohm, C. Roths, 1993 .

Voltage contrast in integrated circuits with 100 nm spatial resolution by scanning force microscopy

E. Kubalek, F. Saurenbach, C. Bohm, 1993 .

Time resolved near-field scanning optical microscopy

E. Kubalek, W. Mertin, C. Bohm, 1994 .

Electrical characterization of integrated circuits by scanning force microscopy

E. Kubalek, A. Beyer, C. Bohm, 1994 .

Voltage amplitude and voltage phase mapping within sub-/spl mu/m devices by high frequency scanning force microscopy

E. Kubalek, A. Leyk, C. Bohm, 1996, 1996 IEEE MTT-S International Microwave Symposium Digest.

Advanced Diagnosis Techniques for sub-μm Integrated Circuits

E. Wolfgang, G. Solkner, C. Bohm, 1994, ESSCIRC '94: Twientieth European Solid-State Circuits Conference.

104 GHz signals measured by high frequency scanning force microscope test system

D. W. van der Weide, A. Leyk, C. Bohm, 1995 .