Pierre-Didier Mauroux

Analysis and Fault Modeling of Actual Resistive Defects in Flash Memories

Arnaud Virazel, Serge Pravossoudovitch, Alberto Bosio, 2011 .

A test solution for oxide thickness variations in the ATMEL TSTAC™ eFlash technology

L. Dilillo, A. Bosio, P. Girard, 2011, 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).