Jin-Hyeok Choi

Statistical leakage current reduction in high-leakage environments using locality of block activation in time domain

Jin-Hyeok Choi, Yingxue Xu, T. Sakurai, 2004, IEEE Journal of Solid-State Circuits.

Electron mobility behavior in extremely thin SOI MOSFET's

Jin-Hyeok Choi, Hong-Shick Min, Young-June Park, 1995, IEEE Electron Device Letters.

Real impact of dynamic operation stress during burn-in on DRAM retention time

Jin-Hyeok Choi, Il-Gweon Kim, Se-Kyeong Choi, 2004, IEEE Transactions on Electron Devices.

Body-contacted SOI MOSFET structure with fully bulk CMOS compatible layout and process

Jin-Hyeok Choi, Ji-Woon Yang, Yo-Hwan Koh, 1997, IEEE Electron Device Letters.