H. Tajiri

Simultaneous measurement of the phase and group indices and the thickness of transparent plates by low-coherence interferometry.

M. Ohmi, M. Haruna, M Haruna, 1998, Optics letters.

Simultaneous Measurement of Refractive Index and Thickness of Transparent Plates by Low Coherence Interferometry

Masato Ohmi, Masamitsu Haruna, M. Ohmi, 1997 .