C. Stadelhoff

Recording of Artifact-Free Reflection Data with a Laser and Fluorescence Scanning Mammograph for Improved Axial Resolution

R. Macdonald, H. Rinneberg, D. Grosenick, 2008 .

Time-frequency analysis assisted reconstruction of ruthenium optical constants in the sub-EUV spectral range 8 nm – 75 nm

Jena, Belgium, H Germany, 2021, Optics Express.

Experimental determination of differential scattering coefficients for nickel by means of linearly polarized x-ray radiation

B. Beckhoff, J. Weser, Y. Kayser, 2023, Metrologia.

Characterization of the polarization properties of PTB's EUV reflectometry system

Andreas Fischer, Frank Scholze, Christian Buchholz, 2010, Advanced Lithography.

Update on EUV radiometry at PTB

Christian Buchholz, Frank Scholze, Victor Soltwisch, 2016, SPIE Advanced Lithography.