Jongsun Bae

Soft Error Issues with Scaling Technologies

Sanghyeon Baeg, Sang Hoon Jeon, Soonyoung Lee, 2012, 2012 IEEE 21st Asian Test Symposium.

Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress

Sungju Park, Sanghyeon Baeg, Jongsun Bae, 2012, IEEE Transactions on Instrumentation and Measurement.

Development of thermal neutron SER-resilient high-k/metal gate technology

Sangwoo Pae, Kyungsik Park, Jongsun Bae, 2014, 2014 IEEE International Reliability Physics Symposium.