R. Moellers

发表

Argon cluster ion beams for organic depth profiling: results from a VAMAS interlaboratory study.

M. Seah, A. Shard, R. Havelund, 2012, Analytical chemistry.

Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers

P. Bertrand, A. Delcorte, E. Niehuis, 2013, Analytical and Bioanalytical Chemistry.

TOF‐SIMS depth profiling of multilayer amino‐acid films using large Argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study

P. Bertrand, A. Delcorte, E. Niehuis, 2013 .

The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power

Morgan R Alexander, Alexander Makarov, Rasmus Havelund, 2017, Nature Methods.

Dual beam depth profiling of organic materials: assessment of capabilities and limitations

E. Niehuis, D. Rading, R. Moellers, 2014 .

Depth profiling of organic materials using improved ion beam conditions

T. Grehl, E. Niehuis, H. Cramer, 2008 .

Dual beam depth profiling of polymer materials: comparison of C60 and Ar cluster ion beams for sputtering

E. Niehuis, H. Cramer, D. Rading, 2013 .

Argon cluster ion source evaluation on lipid standards and rat brain tissue samples.

David Touboul, Alain Brunelle, Rasmus Havelund, 2013, Analytical chemistry.

Dual beam depth profiling of organic materials: Variations of analysis and sputter beam conditions

E. Niehuis, F. Kollmer, D. Rading, 2011 .

In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures

H. Hug, L. Bernard, R. Dianoux, 2014 .