Jian Huang

Etch-induced damage of HgCdTe caused by inductively coupled plasma etching technique

Jian Huang, Wenzhong Zhou, Wenting Yin, 2010, International Symposium on Advanced Optical Manufacturing and Testing Technologies (AOMATT).

N2 atmosphere annealing effect on HgCdTe electrical damage induced by ICP etching process

Li He, Jian Huang, Ruijun Ding, 2012, Other Conferences.