A. Ermolieff

发表

Thermal aging of undoped polyaniline: Effect of chemical degradation on electrical properties

J. Travers, D. Rouchon, Y. Kieffel, 2002 .

X-ray photoemission study of various polyimide cleaning processes before metal deposition

A. Ermolieff, S. Marthon, H. Granges, 1994 .

XPS studies of contamination of reactor and silicon surfaces caused by reactive ion etching

A. Ermolieff, S. Marthon, A. Amouroux, 1991 .

Nitridation of polycrystalline titanium as studied by in situ angle‐resolved x‐ray photoelectron spectroscopy

P. Bernard, A. Ermolieff, S. Marthon, 1988 .

XPS characterization of polyaniline filled n+-type porous silicon

Y. Nicolau, A. Ermolieff, 1995 .

Surface composition analysis of HF-vapour-cleaned silicon by X-ray photoelectron spectroscopy

A. Ermolieff, S. Marthon, A. Amouroux, 1991 .

XPS, Raman spectroscopy, X‐ray diffraction, specular X‐ray reflectivity, transmission electron microscopy and elastic recoil detection analysis of emissive carbon film characterization

D. Rouchon, G. Rolland, C. Vannuffel, 2001 .

PECVD silicon oxides as studied by XPS, RBS, ERDA, IRS and ESR

Philippe M Martin, A. Ermolieff, S. Marthon, 1993 .

Surface composition analysis of HF vapour cleaned silicon by X-ray photoelectron spectroscopy

A. Ermolieff, S. Marthon, A. Amouroux, 1991 .

Nitridation of Si (100) made by radio frequency plasma as studied by in situ angular resolved x-ray photoelectron spectroscopy

P. Bernard, A. Ermolieff, S. Marthon, 1986 .

Angular X-ray photoelectron spectroscopy study of N(1s) and O(1s) lines during controlled oxidation of NbN thin film

P. Bernard, A. Ermolieff, 1986 .

Silicon wafer cleaning processes and ozone oxide growth as studied by angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) and ellipsometry

D. Rouchon, F. Tardif, O. Renault, 2002 .

Depth profiling of a silicon nitride layer by 20 keV N+2 ion implantation through an oxide layer as seen by x‐ray photoelectron spectroscopy

A. Ermolieff, S. Marthon, P. Molle, 1990 .

Chemical degradation of aged CSA-protonated PANI films analyzed by XPS

P. Rannou, D. Rouchon, Y. Nicolau, 1999 .

Temperature dependence of the 306 and 227 cm-1 Raman lines in hexagonal ice between 250 and 80 K

P. Faure, A. Ermolieff, A. Chosson, 1976 .

Angle-resolved x-ray photoelectron spectroscopy of ultrathin Al2O3 films grown by atomic layer deposition

D. Rouchon, O. Renault, A. Ermolieff, 2002 .

An XPS comparative study on thermal oxide barrier formation on Nb and NbN thin films

T. Duc, C. Bertrand, M. Girard, 1985 .

Magnetic and transport properties of superconducting (YBa2Cu3O7-δ)1-xAgx ceramics

B. Dwir, D. Pavuna, P. Lejay, 1989 .

High-temperature ion beam synthesis of cubic SiC

A. Papon, G. Rolland, M. Olivier, 1990 .

Chemical defects induced in P(VDF-TrFe) by electron irradiation

F. Macchi, B. Daudin, J. Legrand, 1991 .

Electroluminescence from n+-type porous silicon contacted with layer-by-layer deposited polyaniline

A. Bsiesy, F. Muller, Y. Nicolau, 1995 .

X‐ray photoelectron spectroscopy studies of contamination and cleaning of surfaces exposed to a fluorocarbon plasma

F. Bertin, A. Ermolieff, S. Marthon, 1991 .

Interface and material characterization of thin Al2O3 layers deposited by ALD using TMA/H2O

Olivier Renault, François Martin, L. G. Gosset, 2002 .

X-ray spectroscopy of the oxidation of 6H-SiC(0001)

L. Kubler, T. Billon, A. Ermolieff, 1999 .

Oxidation of 6H-SiC(0001)

L. Kubler, T. Billon, A. Ermolieff, 1999 .

Electrical surface conductivity in quartz induced by ion implantation

M. Dupuy, M. Dufour, A. Ermolieff, 1992 .

Brillouin scattering in ice and deuterated ice as a function of temperature

A. Ermolieff, 1975 .

In-situ ellipsometric and XPS studies on RF sputter cleaning and re-oxidation of thin Nb films

A. Ermolieff, H. Dugourd, 1985 .