R. Inoue

X-ray Photoelectron Spectroscopy (XPS) Appartus Applicable to Combinatorial Process (PHI Quantera II)

N. Sanada, A. Tanaka, R. Inoue, 2011 .

X-Ray Photoelectron Spectroscopy

N. Sanada, R. Inoue, 2006 .

Analysis of buried interfaces in multilayer device structures with hard XPS (HAXPES) using a CrKα source

E. Martinez, O. Renault, J. Mann, 2018 .

Influence of C60 Ion Beam Angle of Incidence Upon XPS Depth Profiling for Polymers

N. Sanada, T. Miyayama, R. Inoue, 2007 .