Y. Iijima
发表
K. Hiraoka,
D. Asakawa,
Y. Sakai,
2009
.
T. Yuji,
Y. Suzaki,
H. Akatsuka,
2010
.
T. Yuji,
Y. Suzaki,
H. Akatsuka,
2008
.
Detection of surface impurities on Si wafers using total reflection x-ray photoelectron spectroscopy
Y. Iijima,
K. Miyoshi,
S. Saito,
1999
.
Y. Iijima,
T. Tazawa,
2004
.
K. Hiraoka,
Y. Iijima,
S. Matsumoto,
1994
.
T. Miyakoshi,
Y. Iijima,
Noriyasu Niimura,
2002
.
T. Miyakoshi,
Y. Iijima,
Noriyasu Niimura,
1996
.
T. Miyakoshi,
Y. Iijima,
Noriyasu Niimura,
1993
.
K. Hiraoka,
Y. Iijima,
Noriyasu Niimura,
1996
.
K. Hiraoka,
D. Asakawa,
Y. Sakai,
2010
.
K. Hiraoka,
Y. Sakai,
Y. Iijima,
2011
.
K. Hiraoka,
Y. Sakai,
Y. Iijima,
2010
.
K. Hiraoka,
K. Mori,
D. Asakawa,
2009
.
K. Hiraoka,
D. Asakawa,
Y. Sakai,
2009
.
K. Hiraoka,
D. Asakawa,
Y. Sakai,
2009
.
K. Hiraoka,
K. Mori,
Y. Sakai,
2008
.
K. Hiraoka,
Y. Sakai,
Y. Iijima,
2008
.
K. Mori,
Y. Sakai,
Y. Iijima,
2008
.
Y. Iijima,
2016
.
K. Hiraoka,
Y. Sakai,
Y. Iijima,
2013
.
K. Hiraoka,
M. Naruse,
Y. Sakai,
2011
.
M. Komiyama,
H. Shigekawa,
R. Yoshizaki,
1996
.
K. Hiraoka,
Tetsuya Sato,
Y. Iijima,
1994
.
K. Hiraoka,
Y. Sakai,
Y. Iijima,
2011
.
Y. Iijima,
K. Miyoshi,
1999
.
Y. Iijima,
K. Miyoshi,
2000
.
K. Hiraoka,
Y. Iijima,
Kazuomi Sato,
2000
.
K. Hiraoka,
M. Uemura,
Y. Iijima,
1993
.