F. Ishida

The surface characterization of the early stages of the oxidation of titanium

A. Tanaka, Y. Takakuwa, T. Homma, 2000 .

Phase transition from Langmuir-type adsorption to two-dimensional oxide island growth during oxidation on Si(0 0 1) surface

Y. Takakuwa, F. Ishida, T. Kawawa, 2003 .

Real-time Monitoring of Si Thermal Oxidation by Auger Electron Spectroscopy Combined with Reflection High-Energy Electron Diffraction.

Y. Takakuwa, F. Ishida, 2001 .

Time evolution of interface roughness during thermal oxidation on Si(0 0 1)

Y. Takakuwa, F. Ishida, T. Kawawa, 2002 .

Oxygen pressure dependence of the initial oxidation on Si[001] surface studied by AES combined with

Y. Takakuwa, F. Ishida, T. Kawawa, 2001, Digest of Papers. Microprocesses and Nanotechnology 2001. 2001 International Microprocesses and Nanotechnology Conference (IEEE Cat. No.01EX468).