J. Geller

发表

Computer-aided surface analysis techniques

J. Geller, 1991 .

Titanium disilicide formation by wide‐area electron beam irradiation

J. Rocca, P. Russell, G. Collins, 1984 .

Large Area Continuous Electron Beam for Semiconductor Processing

J. Rocca, P. Russell, G. Collins, 1983 .

Accurate measurement of sputtered depth for ion sputtering rates and yields: the mesh replica method

Masatoshi Suzuki, M. Seah, J. Geller, 2007 .

Depth resolution improvements using specimen rotation during depth profiling

J. Geller, Nina Veisfeld, 1989 .

Ion sputtering yield measurements for submicrometer thin films

J. Geller, Nina Veisfeld, 1988 .

Sample Preparation for Electron Probe Microanalysis—Pushing the Limits

J. Geller, P. D. Engle, 2002, Journal of research of the National Institute of Standards and Technology.

A novel CMA alignment technique for Auger spectroscopy

J. Geller, 1984 .

Approaches to analyzing insulators with Auger electron spectroscopy: Update and overview

M. Seah, D. Baer, L. Kövér, 2010 .

High Count Rate Electron Probe Microanalysis

C. Herrington, J. Geller, 2002, Journal of research of the National Institute of Standards and Technology.