Pierre Chevalier

Fatigue behavior of composite laminates with automated fiber placement induced defects- a review

Z. Gürdal, C. Kassapoglou, Pierre Chevalier, 2020 .

Rapid Tools for an AFP Manufacturing Defects Assessment Framework

Z. Gürdal, R. Harik, B. Tatting, 2018 .

Rigorous Model-Based Mask Data Preparation Algorithm Applied to Grayscale Lithography for the Patterning at the Micrometer Scale

P. Quéméré, J. Vaillant, Pierre Chevalier, 2021, Journal of Microelectromechanical Systems.

Beyond contrast curve approach: a grayscale model applied to sub-5μm patterns

Patrick Quéméré, Sébastien Bérard-Bergery, Charlotte Beylier, 2019, Advanced Lithography.