M. Ritter

Resistance change in on-chip aluminum interconnects under cyclic thermo-mechanical stress

M. Pfost, M. Ritter, 2019, Microelectronics Reliability.

Influence of metallization layout on aging detector lifetime under cyclic thermo-mechanical stress

M. Pfost, M. Ritter, G. Pham, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).

Mechanical failure dependence on the electrical history of lead zirconate titanate thin films

S. Trolier-McKinstry, R. Bermejo, M. Ritter, 2020 .

On-Chip Sensors to Detect Impending Metallization Failure of LDMOS Transistors Under Repetitive Thermo-Mechanical Stress

Martin Pfost, Matthias Ritter, Gimi Pham, 2016, IEEE Transactions on Semiconductor Manufacturing.

Efficient Simulation of Thermo-Mechanical Stress in the On-Chip Metallization of Integrated Power Semiconductors

Martin Pfost, Matthias Ritter, Gimi Pham, 2017, IEEE Transactions on Device and Materials Reliability.